S O L U T I O N S   f o r  
T H I N - F I L M   M E A S U R E M E N T
From ellipsometry and reflectometry to stylus
The stage cross-section is maximized in order to provide
measurements, today’s fab has a large number of options
available for the characterization of thin films. Aerotech has
the superior stiffness required in thin-film measurement
developed a wide variety of motion systems to address these
applications.
needs.
Clean-room compatible designs incorporate special
cable management, lubrication, and a waycover.
Multiple encoder options allow for two levels of stage
performance.
A clean-room compatible cable
management system (CMS) is part of
the ALS20000 XY stage.
Automation 3200 digital automation platform with Ndrive digital drive and Npaq drive rack. Aerotech provides turnkey solutions with high-
performance mechanics and electronics.
Aerotech's Expanded Clean-Room Capabilities

Aerotech at a Glance

Semiconductor and Flat-Panel Applications

Solutions for Reticle Inspection

Solutions for Lithography

Solutions for Defect Detection (Optical Inspection)

Solutions for Electrical Characterization

Solutions for Macro-Defect Detection

Solutions for Thin-Film Measurement

Solutions for Vacuum Applications

Solutions for Flat-Panel Display Manufacturing

Linear Solutions

Z-Axis Solutions

Rotary Solutions

Specialty Solutions

Component Solutions

Automation 3200 Digital Automation Platform

Intelligent, Networked Drives

Simplfied Integration...Reduced Cost

Machine Retrofits

Fully Integrated Automation Solutions

Engineered Systems

ISO Registered
Award-Winning Aerotech

Worldwide Training & Support
Aerotech Timeline

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